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VTS 2007 25th Anniversary Logo

25th IEEE VLSI TEST SYMPOSIUM (VTS 2007)
May 6th - May 10th, 2007
Northern California, USA

http://www.tttc-vts.org

CALL FOR PAPERS

Scope -- Author Information -- Committees

Scope

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The IEEE VLSI Test Symposium (VTS) celebrates it’s twenty-fifth year of exploring trends and novel concepts in testing, and verification/validation of microelectronic circuits and systems. Major topics include, but are not limited to:

  • Analog, M-S & RF Test
  • Automatic Test Generation
  • ATE Architecture & SW
  • Board & System Test
  • Built-In Self-Test (BIST)
  • Current Based Test
  • Defect Tolerance
  • Delay & Performance Test
  • Design for Testability (DFT)
  • Design Verification/Validation
  • Diagnosis and Debug
  • Embedded System Test
  • Embedded Test Methods
  • Fault Modeling & Simulation
  • Infrastructure IP
  • MEMS Test
  • Memory Test and Repair
  • Microprocessor Test
  • Multi-Chip Module Test
  • Nanometer Technologies Test
  • On-Line Test
  • Power Issues in Test
  • Self-Repair & Fault Tolerance
  • System-on-Chip (SoC) Test
  • System-in-Package Test
  • Test Resource Partitioning
  • Thermal Test
  • Test Data Compression
  • Test of High-Speed I/
  • Test Quality and Reliability
  • Test Resource Partitioning
  • Transients and Soft Errors
  • Yield Analysis & Optimization

Author Information

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The VTS 2007 website is open for submissions:

http://www.tttc-vts.org/public_html/new/2007/submissions.php

The VTS Program Committee invites original, unpublished paper submissions for VTS 2007. Paper submissions should be complete manuscripts, not exceeding six pages (inclusive of figures, tables, and bibliography) in a standard IEEE two-column format. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status. On the title page, please include: author name(s) and affiliation(s), and the mailing address, phone number, fax number, and e-mail address of the contact author. A 50-word abstract and five keywords identifying the topic area are also required.

Proposals for the Innovative Practices Track, and Special Sessions are also invited. The innovative practices track will highlight cutting-edge challenges faced by test practitioners, and innovative solutions employed to address them. Special sessions can include panels, embedded tutorials, or hot topic presentations. Innovative practices track and special session proposals should include a title, name and contact information of the session organizer(s), a 150 to 200 word abstract, and a list of prospective participants.

All submissions are to be made electronically through the VTS website. The deadline for all submissions is October 9th, 2006. Authors will be notified of the disposition of their papers by January 8th, 2007. A submission will be considered as evidence that, upon acceptance, the author(s) will present the paper at the symposium, and will submit a final camera-ready version of the paper for inclusion in the proceedings. In the case of innovative practice and special sessions, the organizers commit to submitting a session title, abstract, and list of participants for inclusion in the symposium proceedings and program.

VTS 2007 will present a Best Paper Award, a Best Panel Award, and a Best IP Track Session Award based on the evaluations of reviewers, attendees, and an invited panel of judges. TTTC Test Technology Educational Program (TTEP) tutorials on emerging test technology topics will be offered during VTS 2007. Tutorial proposals should be submitted according to TTEP 2007 submission deadlines (http://computer.org/tab/tttc/teg/ttep).

For general information:

GENERAL CHAIR
Paolo Prinetto
Politecnico di Torino
Dip. di Automatica e Informatica
Corso Duca degli Abruzzi 24
I-10129 Torino TO, Italy.
T: +39-011-564-7007
E: Paolo.Prinetto@polito.it

For submission related information:

PROGRAM CHAIR
Alex Orailoglu
University of California, San Diego
Dept. of Computer Science and Eng.
9500 Gilman Drive, Mail Code 0114
La Jolla, CA 92093-0114, USA
T: +1-858-534-0914
E: alex@cs.ucsd.edu

Committees

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General Chair
P. Prinetto - Poli. di Torino

Program Chair
A. Orailoglu - UC San Diego

Vice-General Co-Chairs
S. M. Reddy - U Iowa
H.-J. Wunderlich - U Stuttgart

Vice-Program Co-Chairs
J. Segura - U Illes Balears
B. West - Credence

New Topics
B. Courtois - TIMA

Special Sessions
P. Maxwell - Avago
C. Metra - U Bologna

Innovative Practices Track
K. Hatayama - Renesas
S. Mitra - Intel

Publicity
A. Raghunathan - NEC

Audio/Visual
D. Gizopoulos - U Piraeus

Finance
M. Abadir - Freescale

Publications
S. Ravi - NEC

Local Arrangements
M. Renovell - LIRMM

Ex-Officio
Y. Zorian - Virage Logic

Steering Committee
J. Figueras - U Poli. Catalunya
A. Ivanov - UBC
M. Nicolaidis - TIMA
R. Roy - Zenasis
A. Singh - Auburn U
P. Varma - Blue Pearl
Y. Zorian - Virage Logic

For more information, visit us on the web at: http://www.tttc-vts.org

The 25th IEEE VLSI TEST SYMPOSIUM (VTS 2007) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).


IEEE Computer Society- Test Technology Technical Council

TTTC CHAIR
André IVANOV
University of British Columbia - Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

SENIOR PAST CHAIR
Yervant ZORIAN
Virage Logic - USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com


TTTC 2ND VICE CHAIR
Joan FIGUERAS
Universitat Politècnica de Catalunya - Spain
Tel. +34-93-401-6603
E-mail figueras@eel.upc.es

FINANCE
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

DESIGN & TEST MAGAZINE
Tim CHENG
University of California, Santa Barbara - USA
Tel. +1-805-893-72942
E-mail timcheng@ece.ucsb.edu

TECHNICAL MEETINGS
Chen-Huan CHIANG

Lucent Technologies
- USA
Tel. +1-732-949-5539
E-mail chenhuan@lucent.com

TECHNICAL ACTIVITIES
Victor Hugo CHAMPAC
Instituto Nacional de Astrofisica - Mexico
Tel.+52-22-470-517
E-mail champac@inaoep.mx

ASIA & SOUTH PACIFIC
Hideo FUJIWARA
Nara Institute of Science and Technology - Japan
Tel. +81-74-372-5220
E-mail fujiwara@is.aist-nara.ac.jp

LATIN AMERICA
Marcelo LUBASZEWSKI
Federal University of Rio Grande do Sul - Brazil
Tel. +34-93-401-6603
E-mail luba@vortex.ufrgs.br

NORTH AMERICA
William R. MANN
Tel. +1-949-645-3294
E-mail william.mann@ieee.org

COMMUNICATIONS
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

INDUSTRY ADVISORY BOARD
Yervant ZORIAN
Virage Logic - USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

 

PAST CHAIR
Paolo PRINETTO
Politecnico di Torino - Italy
Tel. +39-011-564-7007
E-mail Paolo.Prinetto@polito.it

TTTC 1ST VICE CHAIR
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

SECRETARY
Christian LANDRAULT
LIRMM - France
Tel. +33-4-674-18524
E-mail landrault@lirmm.fr

INTERNATIONAL TEST CONFERENCE
Scott DAVIDSON
Sun Microsystems
- USA
Tel. +1-650-786-7256
E-mail scott.davidson@eng.sun.com

TEST WEEK COORDINATION
Yervant ZORIAN
Virage Logic - USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

TUTORIALS AND EDUCATION
Dimitris GIZOPOULOS

University of Piraeus
- Greece
Tel. +30-210-414-2372
E-mail dgizop@unipi.gr

STANDARDS
Rohit KAPUR

Synopsys
- USA
Tel. +1-650-934-1487
E-mail rkapur@synopsys.com

EUROPE
Zebo PENG
Linköping University - Sweden
Tel. +46-13-282-067/-281-000
E-mail zpe@ida.liu.se

MIDDLE EAST & AFRICA
Ibrahim HAJJ
American University of Beirut - Lebanon
Tel. +961-1-341-952
E-mail ihajj@aub.edu.lb

STANDING COMMITTEES
Michael NICOLAIDIS
iRoC Technologies - France
Tel. +33-4-381-20763
E-mail michael.nicolaidis@iroctech.com

ELECTRONIC MEDIA
Alfredo BENSO
Politecnico di Torino - Italy
Tel. +39-011-564-7080
E-mail alfredo.benso@polito.it


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